Inside Out

Inside Out: Inverse Problems and Applications In this volume, leading experts in the theoretical and applied aspects of inverse problems offer extended surveys on several important topics in modern inverse problems, such as microlocal analysis, reflection seismology, tomography, inverse scattering, and X-ray transforms. Wydawnictwo: Cambridge University Press Rok wydania: 2003 Okładka: twarda Liczba stron: 414 Wymiary: 16 x 24.2 x 2.9 cm Język: angielski ISBN: 9780521824699