Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications Servin Manuel ,Quiroga J. Antonio ,Padilla Moises Wydawca: Wiley-VCH Verlag GmbH Data wydania: 2014 ISBN: 9783527411528 Liczba stron: 344 Format: 250 x 175 x 22 Rodzaj oprawy: Hardback Opis produktu: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.