In-Situ Transmission Electron Microscopy

In-Situ Transmission Electron Microscopy This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. Wydawnictwo: Springer Rok wydania: 2023 Okładka: twarda Liczba stron: 371 Wymiary: 23.5 x 15.5 cm Ilustracje: 157 Illustrations, color; 37 Illustrations, black and white; XIII, 371 p. 194 illus., 157 illus. in color. Język: angielski ISBN: 9789811968440