Advances in X-Ray Analysis: Volume 10

Advances in X-Ray Analysis: Volume 10 The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here. Autor: Gavin R. Mallett, John B. Newkirk Wydawnictwo: Springer Us Rok wydania: 2012 Okładka: miękka Liczba stron: 572 Wymiary: 25.4 x 17.8 x 3.3 cm Język: angielski ISBN: 9781468478372