In Situ Characterization of Thin Film Growth

In Situ Characterization of Thin Film Growth group work Wydawca: Elsevier Science & Technology Data wydania: 2011 ISBN: 9781845699345 Liczba stron: 296 Format: 234 x 167 x 21 Rodzaj oprawy: Hardback Opis produktu: Part one reviews electron diffraction techniques, including the methodology for taking observations and measurements. Part two covers photoemission techniques; the principles and instrumentation. Part three contains alternative in-situ characterisation techniques and the trend for combining different techniques.