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METRIC CULTURE: ONTOLOGIES OF SELF-TRACKING PRACTICES

Btihaj Ajana

Wydawca: Emerald Publishing Limited

Druk
EN
2018
Popularnonaukowe

Metric Culture: Ontologies of Self-Tracking Practices Praca zbiorowa Wydawca: Emerald Publishing Limited Data wydania: 2018 ISBN: 9781787432901 Liczba stron: 288 Format: 161 x 238 x 25 Rodzaj oprawy: Hardback Opis produktu: Data and metrics play an unmistakably powerful role in today s society. Over the years, their use has expanded to cover almost every sphere of everyday life. This book provides a critical investigation into what we can call a metric culture in which practices of self-tracking and quantification have become more popular than ever before.

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